Ion Chromatography Columns (Cation Analysis)

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YS-50
  • High performance type of YK-421
  • Applicable to both suppressor and non-suppressor methods
  • Provides sharp peaks; more significant for divalent cation analysis
  • Supports the analysis of alkylamines and transition metals
  • Fulfills USP-NF L125 requirements
YK-421
  • Column for cation analysis with non-suppressor method
  • Simultaneous analysis of monovalent and divalent cations
  • Suitable separating of alkylamines
  • Fulfills USP-NF L76 requirements

For non-suppressor method/suppressor method

(Standard columns)   [Housing material: SUS]Scroll
Product code Product name Plate number
(TPN/column)		 Functional group Particle size (μm) Column size (mm)
I.D. x Length
F7122000 IC YS-50 ≥ 5,500 Carboxyl  5 4.6 x 125
F6700530 IC YS-G (guard column) Carboxyl  5 4.6 x   10
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Product name Maximum pressure
(MPa/column)		 Flow rate (mL/min) Temperature
range (℃)		 pH range Shipping solvent
Recommended Maximum
IC YS-50 15 1.0 2.0 20 - 60 2 - 12 10 mM Na2SO4 aq.
IC YS-G - - - 20 - 60 2 - 12 10 mM Na2SO4 aq.

For non-suppressor method

(Standard columns)   [Housing material: SUS]Scroll
Product code Product name Plate number
(TPN/column)		 Functional group Particle size (μm) Column size (mm)
I.D. x Length
F7120012 IC YK-421 ≥ 2,800 Carboxyl 5 4.6 x 125
F6709608 IC YK-G (guard column) Carboxyl 5 4.6 x   10
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Product name Maximum pressure
(MPa/column)		 Flow rate (mL/min) Temperature
range (℃)		 pH range Shipping solvent
Recommended Maximum
IC YK-421 15 1.0 1.5 RT - 60 2 - 7 5 mM Tartaric acid + 1 mM Dipicolinic acid
+ 24 mM Boric acid aq.
IC YK-G - - - RT - 60 2 - 7 5 mM Tartaric acid + 1 mM Dipicolinic acid
+ 24 mM Boric acid aq.

Operation Manual / Certificate of Analysis

Operation Manuals and Certificate of Analysis / Inspection Certificate for the following products can be downloaded here.

Product Name Index

Related Products

Product Information (Related Information)

General Information on Packed Columns

introduction of column cleaning procedure and column test conditions etc.